Research
Prof. Zonghoon Lee’s Atomic-Scale Electron Microscopy Lab
Prof. Zonghoon Lee’s Atomic-Scale Electron Microscopy Lab
The unique intrinsic and extrinsic defects of low-dimensional materials bring extraordinary electrical, optical, and magnetic properties. We identify various new types of defects of low-dimensional materials (e.g., vacancy, adatoms, line defects, grain boundary, edges). Moreover, we study chemical states, formation mechanisms, and its novel properties induced by defects.