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Research

Prof. Zonghoon Lee’s Atomic-Scale Electron Microscopy Lab

Research

Atomic-Scale Defects Study

The unique intrinsic and extrinsic defects of low-dimensional materials bring extraordinary electrical, optical, and magnetic properties. We identify various new types of defects of low-dimensional materials (e.g., vacancy, adatoms, line defects, grain boundary, edges). Moreover, we study chemical states, formation mechanisms, and its novel properties induced by defects.

Identification of defects of 2D materials

Defect formation mechanism

Defect-driven growth of 2D materials

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