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Research

Prof. Zonghoon Lee’s Atomic-Scale Electron Microscopy Lab

Research

In Situ TEM Characterization: mechanical, thermal, and electrical experiments

Investigation on deformation and phase transformation of materials with external stimuli including mechanical, thermal, and electrical inputs is significant for design, manipulation and maintenance of the materials. We elucidate correlation of microstructure-property of low dimensional materials at atomic-scale with mechanical, thermal, and electrical stimuli through the combination of state-of-art in situ Transmission Electron Microscope (TEM) holders and aberration-corrected TEM.

in situ TEM-mechanical (and electrical) study

in situ TEM-thermal (and electrical) study

in situ TEM-electrical biasing study

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